首页> 外国专利> PROCESS DETECTING IONIZING RADIATION, DETECTOR AND USE OF FIELD-EFFECT METAL-OXIDE-SEMICONDUCTOR TRANSISTOR IN IT

PROCESS DETECTING IONIZING RADIATION, DETECTOR AND USE OF FIELD-EFFECT METAL-OXIDE-SEMICONDUCTOR TRANSISTOR IN IT

机译:过程检测中的电离辐射,检测器及其中场效应金属氧化物-半电子晶体管的使用

摘要

FIELD: detection of ionizing radiation. SUBSTANCE: uncovered section 17 is created on surface of floating gate of field-effect MOS transistor that forms detector. Field-effect MOS transistor is so used that charge is formed on its floating gate and this charge changes as result of ionizing radiation to which transistor is subjected. Radiation dose is determined by change that takes places in charge on gate. For increase of sensitivity and expansion of range of measured doses when ionizing radiation is detected there is provided possibility of exertion of effect of radiation on surface of floating gate 13 of field-effect MOS transistor 10 through air or gas space. EFFECT: increased sensitivity of detector and expanded range of measured doses of ionizing radiation. 13 cl, 7 dwg
机译:领域:电离辐射的检测。物质:在构成检测器的场效应MOS晶体管的浮栅表面上形成未覆盖的区域17。如此使用场效应MOS晶体管,以便在其浮栅上形成电荷,并且该电荷由于晶体管所受到的电离辐射而改变。辐射剂量取决于门上电荷的变化。为了在检测到电离辐射时提高灵敏度并扩大测量剂量的范围,提供了通过空气或气体空间在场效应MOS晶体管10的浮栅13的表面上施加辐射效应的可能性。效果:提高了探测器的灵敏度,并扩大了电离辐射剂量的测量范围。 13厘升,7载重吨

著录项

  • 公开/公告号RU2138065C1

    专利类型

  • 公开/公告日1999-09-20

    原文格式PDF

  • 申请/专利权人 RADOS TEKNOLODZHI OJ (FI);

    申请/专利号RU19960110207

  • 发明设计人 JUKKA KAKHILAJNEN;

    申请日1994-10-28

  • 分类号G01T1/24;H01L27/14;G01T1/02;A61B6/00;

  • 国家 RU

  • 入库时间 2022-08-22 02:13:37

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