首页> 外国专利> A method for the pretreatment of aluminum surfaces of a vapor deposition chamber upstream of the application of a tungsten silicide - layer on a substrate in the chamber

A method for the pretreatment of aluminum surfaces of a vapor deposition chamber upstream of the application of a tungsten silicide - layer on a substrate in the chamber

机译:在沉积硅钨层之前在气相沉积室的铝表面进行预处理的方法。

摘要

PURPOSE: To prevent the occurrence of particulates in a deposition chamber and to obtain high quality tungsten silicide coatings on substrates processed first after cleaning the chamber by subjecting surfaces in the chamber including surfaces of susceptors, etc., having the aluminum nitride surfaces to specified pretreatment. ;CONSTITUTION: After a previous cleaning step, a vacuum deposition chamber is pretreated as follows; a gas contg. a gaseous tungsten feed source such as WF6 and gaseous silane (SiH4) is allowed to flow into the chamber to form a 1st tungsten silicide deposition on aluminum-bearing surfaces in the chamber and then a gas contg. the gaseous tungsten feed source and a gaseous chlorosilane such as dichlorosilane, monochlorosilane or trichlorosilane is allowed to flow into the chamber to form a 2nd tungsten silicide deposition on the 1st tungsten silicide deposition.;COPYRIGHT: (C)1995,JPO
机译:目的:为了防止在沉积室中发生颗粒,并在清洁室后首先进行处理的基板上获得高质量的硅化钨涂层,方法是使室中的表面(包括基座等)的表面经过氮化铝表面的指定预处理。 ;组成:在先前的清洁步骤之后,真空沉积室的预处理如下:气续使诸如WF 6 的气态钨进料源和气态硅烷(SiH 4 )流入室中,以在硅中的含铝表面上形成第一个硅化钨沉积物腔室,然后是气体。使气态钨进料源和气态氯硅烷(例如二氯硅烷,一氯硅烷或三氯硅烷)流入室中,在第一硅化钨沉积物上形成第二硅化钨沉积物。版权所有:(C)1995,JPO

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