首页> 外国专利> Method of attack of the slices of semi conducting -.

Method of attack of the slices of semi conducting -.

机译:半导体切片的攻击方法-。

摘要

The electrochemical stop etching is favorably carried out by the application of any voltage without permitting current that is caused by aluminum remainder to leak and avoiding short-circuits between the low-resistance layer in the scribe region and the isolation. In a method of producing semiconductor devices relying upon the electrochemical stop etching, major circuits are constituted and ground aluminum wirings 5 are formed on at least one surface of a substrate 7, and their peripheries are surrounded by scribe regions to form a plurality of chip patterns 1. On the same surface of the substrate 7 where chip patterns 1 are formed, aluminum wirings 3 for etching are formed via a field oxide film 10 while maintaining a predetermined gap relative to the GND aluminum wirings and maintaining an equal height and surrounding the chip patterns 1 in the scribe regions. The neighboring aluminum wirings 3 for etching are electrically connected together among the chip patterns 1 that neighbor one another, and a predetermined voltage is applied to the aluminum wirings 3 for etching to effect the electrochemical stop etching.
机译:通过施加任何电压有利地进行电化学停止蚀刻,而不允许由铝残留物引起的电流泄漏并且避免划片区域中的低电阻层与隔离之间的短路。在一种依靠电化学停止蚀刻的半导体器件的制造方法中,构成主要电路,并在基板7的至少一个表面上形成接地的铝布线5,并且它们的周围被划线区域包围以形成多个芯片图案。 1.在基板7的形成有芯片图案1的同一表面上,经由场氧化膜10形成用于蚀刻的铝布线3,同时相对于GND铝布线保持预定的间隙,并且保持相等的高度并围绕芯片。划线区域中的图形1。在彼此相邻的芯片图案1之间将用于蚀刻的相邻的铝布线3电连接在一起,并且将预定电压施加到用于蚀刻的铝布线3,以进行电化学停止蚀刻。

著录项

  • 公开/公告号FR2718286B1

    专利类型

  • 公开/公告日1999-06-11

    原文格式PDF

  • 申请/专利权人 NIPPONDENSO CO LTD;

    申请/专利号FR19950003777

  • 申请日1995-03-30

  • 分类号H01L21/306;H01L21/768;

  • 国家 FR

  • 入库时间 2022-08-22 02:10:43

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号