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CMOS integrated circuit having a sacrificial metal spacer for producing graded NMOS source/drain junctions dissimilar from PMOS source/drain junctions

机译:具有牺牲性金属间隔物的CMOS集成电路,用于产生与PMOS源极/漏极结不同的渐变NMOS源极/漏极结

摘要

An integrated circuit is formed whereby junction of NMOS transistors are formed dissimilar to junctions of PMOS transistors. The NMOS transistors include an LDD area, an MDD area and a heavy concentration source/drain area. Conversely, the PMOS transistor include an LDD area and a source/drain area. The NMOS transistor junction is formed dissimilar from the PMOS transistor junction to take into account the less mobile nature of the junction dopants relative to the PMOS dopants. Thus, a lessening of the LDD area and the inclusion of an MDD area provide lower source/drain resistance and higher ohmic connectivity in the NMOS device. The PMOS junction includes a relatively large LDD area so as to draw the highly mobile, heavy concentration boron atoms away from the PMOS channel.
机译:形成集成电路,由此形成NMOS晶体管的结与PMOS晶体管的结不同。 NMOS晶体管包括LDD区域,MDD区域和重浓度源极/漏极区域。相反,PMOS晶体管包括LDD区域和源极/漏极区域。考虑到结掺杂物相对于PMOS掺杂物的移动性较弱,NMOS晶体管结形成为与PMOS晶体管结不同。因此,减小LDD面积并包括MDD面积在NMOS器件中提供了较低的源极/漏极电阻和较高的欧姆连接性。 PMOS结包括一个相对较大的LDD区域,以便将高迁移率,高浓度的硼原子从PMOS沟道中拉出。

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