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Word line resistance reduction method and design for high density memory with relaxed metal pitch

机译:减小金属间距的高密度存储器的字线电阻降低方​​法和设计

摘要

A method and design for stitching polysilicon wordlines to straps formed of interconnected metal line segments formed in two or more metallization levels. Each strap comprises a continuous conductive metal line passing alternatively from one metal layer to another in a selected sequence. The sequence of segments in each strap alternates in phase with the sequence in next nearest neighbor straps but may be in phase with second nearest neighbor straps. Thereby the pitch of strap segments on each metallization level is at least twice that of the subjacent polysilicon wordlines. The total length of each metal in each strap is the same in all straps. This arrangement allows the use of metals having different resistivities in each strap with all the straps having identical overall resistance. The metals used in the two or more levels may also have different minimum design rules without compromising the identical overall performance of all the straps. In a second embodiment a method and design is described for doubling the length of polysilicon sub- wordlines in a sub-wordline memory array without reducing performance by connecting sub-wordline to sub-wordline decoders by metal straps connected to the sub-wordlines midpoints.
机译:一种将多晶硅字线缝合到由互连金属线段形成的带中的方法和设计,所述互连金属线段以两个或更多个金属化层形成。每个带包括连续的导电金属线,其以选定的顺序交替地从一个金属层到另一层。每个带中的片段的序列与下一个最近的相邻带中的序列同相交替,但是可以与第二个最近的相邻带中的同相。因此,在每个金属化层上的带段的节距至少是下面的多晶硅字线的节距的两倍。每个皮带中每种金属的总长度在所有皮带中都相同。这种布置允许在每个带中使用具有不同电阻率的金属,而所有带具有相同的总电阻。在两个或更多个级别中使用的金属也可能具有不同的最小设计规则,而不会影响所有表带的相同整体性能。在第二实施例中,描述了一种方法和设计,其用于通过子字线存储器阵列中的多晶硅子字线的长度加倍而不会通过通过连接到子字线中点的金属带将子字线连接到子字线解码器来降低性能。

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