TEST DEVICE FOR JTAG-BASED INTEGRATED CIRCUITS AND TEST SYSTEM FOR TESTING INTEGRATED CIRCUITS

摘要

PROBLEM TO BE SOLVED: To obtain a test device which supports an embedded debugging protocol by providing a programmable switch which forms a test loop between a master controller and a selected integrated circuit. ;SOLUTION: The programmable switch 204 is connected to a slave target device 206 which includes JTAG-based integrated circuits IC1 to IC4. At least one of the integrated circuits IC1 to IC4 is an on-chip debugging support(OCDS) integrated circuit which has an on-chip debugging circuit. A switch controller 218 included in the master controller 202 sends a switch control signal out and a programmable switch 204 connects one integrated circuit selected out of the ICI to IC4 to a JTAG controller 210. The controller 210 functionally tests, for example, the integrated circuit ICI by using the corresponding JTAG test protocol.;COPYRIGHT: (C)2000,JPO