首页> 外国专利> Microprobe chip for detecting evanescent waves and method for making the same, probe provided with the microprobe chip and method for making the same, and evanescent wave detector, nearfield scanning optical microscope, and information regenerator provided with the microprobe chip

Microprobe chip for detecting evanescent waves and method for making the same, probe provided with the microprobe chip and method for making the same, and evanescent wave detector, nearfield scanning optical microscope, and information regenerator provided with the microprobe chip

机译:用于检测e逝波的微探针芯片及其制造方法,具有该微探针芯片的探针及其制造方法,以及具有该微探针芯片的e逝波检测器,近场扫描光学显微镜和信息再生器

摘要

A microprobe chip for detecting evanescent waves includes a photoconductive material and a substrate for supporting the photoconductive material. The photoconductive material is connected to electrodes formed on the substrate.;A method for making a microprobe chip for detecting evanescent waves includes the following steps of: forming a film comprising a photoconductive material on a peeling layer of a first substrate, the film having a shape of the microprobe chip; and transferring the film on the peeling layer onto a junction layer provided on a second substrate.;A method for making a probe provided with a microprobe chip for detecting evanescent waves includes the following steps of: forming a film comprising a photoconductive material and having the shape of the microprobe chip on a peeling layer of a first substrate; forming a thin film cantilever on a second substrate; and transferring the film on the peeling layer onto a junction layer formed on the thin film cantilever.
机译:用于检测e逝波的微探针芯片包括光电导材料和用于支撑光电导材料的基板。光电导材料连接到形成在基板上的电极。用于制造用于检测van逝波的微探针芯片的方法包括以下步骤:在第一基板的剥离层上形成包括光电导材料的膜,该膜具有微型探针芯片的形状;将剥离层上的膜转移到设置在第二基板上的接合层上的方法。一种用于制造具有用于检测e逝波的微探针芯片的探针的方法包括以下步骤:形成包括光电导材料的膜并具有第一基板的剥离层上的微探针芯片的形状;在第二基板上形成薄膜悬臂;将剥离层上的膜转移到形成在薄膜悬臂上的接合层上。

著录项

  • 公开/公告号EP0853251A3

    专利类型

  • 公开/公告日2000-02-23

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号EP19980100404

  • 发明设计人 YAGI TAKAYUKI;

    申请日1998-01-12

  • 分类号G02B21/00;G01B7/34;

  • 国家 EP

  • 入库时间 2022-08-22 01:48:30

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