首页> 外国专利> Method for measuring argon impurities contained in high-purity oxygen using oxygen triple point and solid oxygen -phase change and low-temperature chamber

Method for measuring argon impurities contained in high-purity oxygen using oxygen triple point and solid oxygen -phase change and low-temperature chamber

机译:利用氧三点和固氧相变低温室测定高纯氧中所含氩杂质的方法

摘要

In the present invention, by analyzing the content of impurities except the argon impurities contained in the measurement sample by the conventional chemical analysis method, the temperature of the high purity measurement sample is lowered to the coagulation temperature or less, , And then the temperature of the high-purity measurement sample was continuously lowered to measure the temperature in accordance with the change of the - phase, which occurs as the liquid turns into a solid. The temperature difference between the reference sample and the measurement sample The present invention provides a method for measuring an argon impurity contained in high-purity oxygen by using an oxygen triple point and a solid oxygen -phase change capable of relatively measuring the content of impurities.;Further, in order to achieve such a measuring method, the present invention provides a vacuum enclosure capable of opening and closing with a vacuum pump (11), first and second radiant heat blocking containers (20a, A sample container 30 installed in a sealed state inside the first radiation blocking container 20a to receive a sample from the outside of the vacuum container 10, And measuring means (31) and a heating means (32) provided around the sample vessel (30) so as to measure the concentration of argon impurities contained in the high purity oxygen using the oxygen triple point and the solid oxygen The present invention is to provide a low-temperature thermostat using the above-
机译:在本发明中,通过用常规化学分析方法分析测量样品中所含的除氩杂质外的杂质含量,将高纯度测量样品的温度降低至凝固温度以下,然后将不断降低高纯度测量样品,以根据-相的变化测量温度,该变化是在液体变成固体时发生的。参考样品和测量样品之间的温差。本发明提供了一种通过使用能够相对地测量杂质含量的氧三相点和固态氧相变化来测量高纯度氧气中所包含的氩杂质的方法。此外,为了实现这种测量方法,本发明提供了一种能够利用真空泵(11),第一和第二辐射热阻挡容器(20a,安装在密封的样品容器30中)打开和关闭的真空外壳。在第一防辐射容器20a的内部状态下,从真空容器10的外部接收样品,并且在样品容器(30)的周围设置有测量装置(31)和加热装置(32),以测量氩气的浓度。利用氧三点和固体氧包含在高纯氧中的杂质本发明提供一种使用ab的低温恒温器超过

著录项

  • 公开/公告号KR19990086110A

    专利类型

  • 公开/公告日1999-12-15

    原文格式PDF

  • 申请/专利权人 정명세;

    申请/专利号KR19980018905

  • 发明设计人 강기훈;송창호;김용규;감기술;

    申请日1998-05-25

  • 分类号G01N31/00;

  • 国家 KR

  • 入库时间 2022-08-22 01:46:29

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