首页> 外国专利> INNER CLOCK GENERATING CIRCUIT SUITABLE FOR SYNCHRONOUS SEMICONDUCTOR MEMORY DEVICE AND INNER CLOCK GENERATING METHOD THEREOF

INNER CLOCK GENERATING CIRCUIT SUITABLE FOR SYNCHRONOUS SEMICONDUCTOR MEMORY DEVICE AND INNER CLOCK GENERATING METHOD THEREOF

机译:适用于同步半导体存储器的内部时钟产生电路及其内部时钟产生方法

摘要

PURPOSE: An inner clock generating circuit suitable for synchronous semiconductor memory device is provided to reduce power consumption and to generate an inner clock accurately synchronized to an external clock by successively the inner clock in a unit delayer and restraining all operation of devices installed in a rear of the unit delayer. CONSTITUTION: A clock buffer(310) converts an external clock with a TTL level provided from a microprocessor or a DRAM controller into a clock with a CMOS level, and outputs the converted clock as a first clock. A main delayer(320) outputs a second clock. A unit delay set(350) receives the first clock, a second clock, and an input clock of the main delayer(320), and generates a phase comparing signal. A period delay set(360-1) generates a period phase comparing signal(T6). A monitoring unit(400) responds to the phase comparing signal and period comparing signals, and restrains an operation of unit delay sets in a period delay set.
机译:用途:提供一种适用于同步半导体存储设备的内部时钟发生电路,以降低功耗,并通过依次在单元延迟器中延迟内部时钟并限制安装在后部的设备的所有操作来生成与外部时钟精确同步的内部时钟单位延迟器。构成:时钟缓冲器(310)将从微处理器或DRAM控制器提供的具有TTL电平的外部时钟转换为具有CMOS电平的时钟,并输出转换后的时钟作为第一时钟。主延迟器(320)输出第二时钟。单位延迟集(350)接收主延迟器(320)的第一时钟,第二时钟和输入时钟,并产生相位比较信号。周期延迟集(360-1)产生周期相位比较信号(T6)。监视单元(400)响应于相位比较信号和周期比较信号,并且将单位延迟集的操作限制在周期延迟集中。

著录项

  • 公开/公告号KR20000026659A

    专利类型

  • 公开/公告日2000-05-15

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR19980044299

  • 发明设计人 LEE SEONG KEUN;

    申请日1998-10-22

  • 分类号G11C11/407;

  • 国家 KR

  • 入库时间 2022-08-22 01:45:50

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