首页> 外国专利> Metal - - - structure of the connecting contact with a small contact resistance and a low loss via gear as well as a method for producing the same.

Metal - - - structure of the connecting contact with a small contact resistance and a low loss via gear as well as a method for producing the same.

机译:接触电阻小,通过齿轮的损耗低的连接触头的金属结构及其制造方法。

摘要

It is a metal - - - structure of the connecting contact with a small contact resistance and a low loss via gear proposed for use in integrated circuits. The contact - structure comprises a connecting - layer of dielectric material on the surface of a semiconductor substrate of an integrated circuit. The connecting - layer of dielectric material has a contact opening, which extend up to a predetermined area of the semiconductor substrate, for example, a source - zone, a drain - zone or a polysilicon - gate layer. The contact - structure further comprises a cobalt silicide or a nickel silicide boundary layer on the surface of the specified range, the with the base surface of the contact opening is aligned. Moreover, it comprises a cobalt - or a nickel adhesive layer on the surface of the side walls of the contact opening, a high melting, based on metal barrier layer on the metal adhesive layer and the metal - silicide boundary layer and a conductive terminating element. The present invention also relates to the manufacturing process for such a contact - structure.
机译:它是一种连接触点的金属结构,具有接触电阻小,通孔损耗低的缺点,建议用于集成电路。接触结构包括在集成电路的半导体衬底的表面上的介电材料的连接层。介电材料的连接层具有接触开口,该接触开口延伸到半导体衬底的预定区域,例如,源极区域,漏极区域或多晶硅栅极层。接触结构还包括在规定范围的表面上的硅化钴或硅化镍边界层,其与接触开口的底面对齐。此外,它包括在接触孔侧壁表面上的钴-或镍粘合层,基于金属粘合层和金属-硅化物边界层上的金属阻挡层的高熔点以及导电终端元件。本发明还涉及这种接触结构的制造方法。

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