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Sputter deposition method, method of manufacturing a sputtering film-forming apparatus and semiconductor device

机译:溅射沉积方法,制造溅射成膜装置的方法和半导体器件

摘要

There is provided an RF sputtering film forming method of forming a compound film having a stable composition by use of stable plasma with a broad process window to thus facilitate composition control of the compound film. In the RF sputtering film forming method, an alternating voltage or alternating current is applied to a part or all of walls positioned on the outside of a space formed between a wafer and a target, or an electron temperature in the plasma is reduced by oscillating the RF power in a pulse fashion, or a sputtering gas is composed of at least one kind of gases of helium, neon, xenon, and krypton, or a minus voltage is applied to a part or all of the walls positioned on the outside of the space formed between the wafer and the target.
机译:提供了一种RF溅射成膜方法,其通过使用稳定的等离子体和宽的工艺窗口来形成具有稳定的组成的化合物膜,从而有利于化合物膜的组成控制。在RF溅射成膜方法中,向位于晶片与靶之间形成的空间的外侧的一部分或全部的壁施加交流电压或交流电流,或者通过使等离子体振荡而降低等离子体中的电子温度。脉冲形式的RF功率或溅射气体由氦,氖,氙和k气中的至少一种气体组成,或者负电压被施加到位于容器外部的部分或全部壁上在晶片和靶之间形成的空间。

著录项

  • 公开/公告号JP3126698B2

    专利类型

  • 公开/公告日2001-01-22

    原文格式PDF

  • 申请/专利权人 富士通株式会社;

    申请/专利号JP19980152749

  • 发明设计人 三原 智;

    申请日1998-06-02

  • 分类号C23C14/34;H01L21/203;H01L21/8242;H01L21/8247;H01L27/10;H01L27/108;H01L29/788;H01L29/792;

  • 国家 JP

  • 入库时间 2022-08-22 01:33:38

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