首页> 外国专利> FORMATION OF VANADIUM OXIDE THIN FILM AND BOLOMETER TYPE INFRARED SENSOR EMPLOYING VANADIUM OXIDE THIN FILM

FORMATION OF VANADIUM OXIDE THIN FILM AND BOLOMETER TYPE INFRARED SENSOR EMPLOYING VANADIUM OXIDE THIN FILM

机译:氧化钒薄膜的形成和采用氧化钒薄膜的Bolometer型红外传感器

摘要

PROBLEM TO BE SOLVED: To make uniform the electric characteristics of a vanadium oxide thin film by heat treating a thin film of vanadium oxide having a specified resistivity at a specified temperature under reducing atmosphere. ;SOLUTION: A thin film of vanadium oxide (VOx: 2.25≤x2.5) is formed on a semiconductor substrate having diameter of 2-7 inch and heat treated at 250-350°C under reducing atmosphere. The thin film of vanadium oxide is formed by low pressure sputtering in reaction gas using metal vanadium as a target. The low pressure is set in the range of 1-4 mTorr. The resistivity is 1-10 Ω and standard deviation thereof is 5-30%. Standard deviation of the temperature coefficient of resistance of the thin film is 1-8%.;COPYRIGHT: (C)2000,JPO
机译:解决的问题:通过在还原性气氛中在规定温度下对具有规定电阻率的氧化钒薄膜进行热处理,使氧化钒薄膜的电特性均匀。 ;解决方案:在直径为2-7英寸的半导体衬底上形成氧化钒薄膜(VOx:2.25×x <2.5),并在还原气氛下于250-350℃进行热处理。以金属钒为靶,在反应气体中通过低压溅射形成氧化钒薄膜。低压设置在1-4 mTorr的范围内。电阻率为1-10Ω。其标准偏差为5-30%。薄膜电阻温度系数的标准偏差为1-8%.;版权所有(C)2000,JPO

著录项

  • 公开/公告号JP2000321124A

    专利类型

  • 公开/公告日2000-11-24

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP19990129060

  • 发明设计人 SASAKI NARIHITO;

    申请日1999-05-10

  • 分类号G01J1/02;C23C14/08;G01J5/02;

  • 国家 JP

  • 入库时间 2022-08-22 01:28:41

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