DEFECT INFORMATION OBTAINING METHOD FOR SEMICONDUCTOR MEMORY, RELIEVING AND ANALYZING DEVICE FOR SEMICONDUCTOR MEMORY, AND SEMICONDUCTOR MEMORY

摘要

PROBLEM TO BE SOLVED: To provide algorithm compressing and analyzing error information quantity by detecting the defect of a line which must be relieved previously when a relieving-analyzing-test of a semiconductor memory is performed. SOLUTION: In a device 120 performing relieving and analyzing of defect information of a semiconductor memory, the device is provided with an address information obtaining means 150 taking in address information corresponding to defect information on a semiconductor memory being a device 100 to be measured, the address information obtaining means 150 is provided with a line defect information obtaining means 150a discriminating the existence of line defect and performing coding when the line is defective, and a bit defect information obtaining means 150b discriminating existence of bit defect and performing coding of bit defect. And, defect information obtained by the address information obtaining means 150 is stored in a storage device 10 for take-in.