首页>
外国专利>
Method of generating r,c parameters corresponding to statistically worst case interconnect delays
Method of generating r,c parameters corresponding to statistically worst case interconnect delays
展开▼
机译:生成与统计上最差情况的互连延迟相对应的r,c参数的方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method of generating R,C parameters corresponding to statistically worst case interconnect delays for computer simulation of integrated circuit designs, comprising the steps of: computing a statistically worst case interconnect delay from randomly generated material and geometry values characterizing an integrated circuit interconnect process; computing a representative set of material and geometry values corresponding to the statistically worst case interconnect delay; and computing R,C parameters corresponding to the statistically worst case interconnect delay from the representative set of material and geometry values.
展开▼