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APPARATUS FOR CHARACTERIZING HIGH TEMPERATURE SUPERCONDUCTING THIN FILM
APPARATUS FOR CHARACTERIZING HIGH TEMPERATURE SUPERCONDUCTING THIN FILM
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机译:表征高温超导薄膜的装置
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摘要
Dielectric resonator devices that measure the parameters of high temperature superconducting thin films displace dielectrics and substrates, hold resonator components in place during use, suppress undesirable modes, control magnetic dipole defects, and couple to electrical circuits. An improved means for making it.
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