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APPARATUS FOR CHARACTERIZING HIGH TEMPERATURE SUPERCONDUCTING THIN FILM.
APPARATUS FOR CHARACTERIZING HIGH TEMPERATURE SUPERCONDUCTING THIN FILM.
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机译:用于表征高温超导薄膜的装置。
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摘要
A dielectric resonator apparatus for measuring the parameters of high temperature superconducting thin film is disclosed having improved means for positioning the dielectric and substrates, holding the resonator components in place during use, suppressing undesirable modes, adjusting the magnetic dipole coupling, and coupling to an electrical circuit.
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