首页> 外国专利> PRECURSOR COMPOUND FOR CHEMICAL VAPOR DEPOSITION OF ALUMINA THIN FILM ON SUBSTRATE AND ITS PRODUCTION

PRECURSOR COMPOUND FOR CHEMICAL VAPOR DEPOSITION OF ALUMINA THIN FILM ON SUBSTRATE AND ITS PRODUCTION

机译:基质上铝薄膜化学气相沉积的前体化合物及其生产

摘要

PURPOSE: A precursor compound for forming an alumina thin film layer on an adhesion film or a diffusion protective film formed on a substrate, process of preparing the same and process for deposition of metal oxide thin films using the same are provided, which can deposit in a wide temperature range and have excellent deposition velocity, dielectric constant, adhesion force and reflectivity of alumina thin films to silicon substrates. CONSTITUTION: An organometallic complex compound of the formula: R'R"R"'Al:Ln capable of depositing high purity alumina thin films on a substrate by chemical vapor deposition methods is prepared by reaction of trialkylaluminium as an organometallic compound with a Lewis base (L) such as hetero cyclic amine at room temperatures without using a solvent. In formula, R'R"R"' are selected from the same or different C1-5 alkyl, perfluoroalkyl or alkoxy or borate (BH4); L is selected from alkylaziridine, alkylazetidine, alkylpyrrolidine, alkylpiperidine, alkylhexamethyleneimine, alkylheptamethyleneimine, alkylmorpoline, 1,4-dialkylpiperazine, thiophene and thiopyran; n is an integer from 1 or 2.
机译:用途:提供用于在粘合膜或在基板上形成的扩散保护膜上形成氧化铝薄膜层的前体化合物,其制备方法以及使用该前体化合物沉积金属氧化物薄膜的方法,该前体化合物可以沉积在温度范围广,氧化铝薄膜对硅基板的沉积速度,介电常数,粘附力和反射率极佳。组成:能够通过化学气相沉积法在基材上沉积高纯度氧化铝薄膜的式为R'R“ R”'Al:Ln的有机金属配合物是通过使三烷基铝作为有机金属化合物与路易斯碱反应而制备的(L)如杂环胺在室温下不使用溶剂。式中,R'R“ R”'选自相同或不同的C1-5烷基,全氟烷基或烷氧基或硼酸盐(BH4); L选自烷基氮丙啶,烷基氮杂环丁烷,烷基吡咯烷,烷基哌啶,烷基六亚甲基亚胺,烷基庚七亚甲基亚胺,烷基吗啉,1,4-二烷基哌嗪,噻吩和噻喃; n是1或2的整数。

著录项

  • 公开/公告号KR20010002148A

    专利类型

  • 公开/公告日2001-01-05

    原文格式PDF

  • 申请/专利权人 UP CHEMICAL CO. LTD.;

    申请/专利号KR19990021795

  • 发明设计人 SHIN HYEON GUK;

    申请日1999-06-11

  • 分类号C07F5/06;

  • 国家 KR

  • 入库时间 2022-08-22 01:14:22

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