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MICROSTRUCTURE PRODUCING METHOD CAPABLE OF CONTROLLING GROWTH POSITION OF MINUTE PARTICLE OR THIN LINE AND SEMICONDUCTOR DEVICE EMPLOYING THE MICROSTRUCTURE

机译:可控制微小粒子或细线的生长位置的微结构制造方法以及采用该微结构的半导体装置

摘要

Fine particles or growth location of the wire, it is possible to achieve good uniformity and reproducibility of the size and density, by a simple process without the use of special fine processing technology, it is possible to reduce the manufacturing cost, yield, and highly productive production gender as the manufacturing method of a fine structure that can realize a semiconductor device having excellent properties suitable as well, there is provided a semiconductor device using the microstructure. To form an oxide film 12 having a semiconductor substrate 11, the film thickness on the surface of the thick region (12a) and a thin film region (12b). Only on the surface of the next, the oxide film 12, the thin film region (12b) of the thickness, are selectively formed in the microstructure of thin wires (15) composed of silicon Si.
机译:细微的颗粒或导线的生长位置,可以实现良好的尺寸和密度的均一性和可重复性,通过简单的工艺,无需使用特殊的精细加工技术,就可以降低制造成本,良率,并且高度作为能够实现同样具有优异特性的半导体装置的微细结构的制造方法的生产性,提供了一种使用该微结构的半导体装置。为了形成具有半导体衬底11的氧化膜12,在厚区域(12a)和薄膜区域(12b)的表面上的膜厚度。仅在下一个表面上,在由硅Si构成的细线(15)的微结构中选择性地形成厚度为薄膜区域(12b)的氧化膜12。

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