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Microstructure producing method capable of controlling growth position of minute particle or thin and semiconductor device employing the microstructure

机译:能够控制微小粒子或薄层的生长位置的微结构制造方法以及使用该微结构的半导体器件

摘要

There is provided a microstructure producing method capable of achieving satisfactory uniformity and reproducibility of the growth position, size and density of a minute particle or thin line and materializing a semiconductor device which can reduce the cost through simple processes without using any special microfabrication technique and has superior characteristics appropriate for mass-production with high yield and high productivity as well as a semiconductor device employing the microstructure. An oxide film 12 having a region 12a of a great film thickness and a region 12b of a small film thickness are formed on the surface of a semiconductor substrate 11. Next, a microstructure that is a thin line 15 made of silicon Si is selectively formed only on the surface of the small-film-thickness region 12b of the oxide film 12.
机译:提供了一种微结构的制造方法,该方法能够实现令人满意的均匀性和生长位置,微小颗粒或细线的尺寸和密度的再现性,并使半导体器件材料化,该方法可以通过简单的工艺降低成本,而无需使用任何特殊的微制造技术,并且具有适于以高产量和高生产率进行批量生产的优良特性,以及采用该微结构的半导体器件。氧化膜 12 具有很大的膜厚度的区域 12 a 和区域 12 b在半导体基板 11 的表面上形成膜厚小的。接下来,仅在小膜厚度区域 12 b 的表面上选择性地形成由硅Si制成的细线 15 的微结构。 I>氧化膜 12。

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