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METHOD FOR MODELING PULSATING IONIZING RADIATION UPON INTEGRAL MICROCIRCUIT ON COMPLEMENTARY METAL- OXIDE-SEMICONDUCTOR STRUCTURES
METHOD FOR MODELING PULSATING IONIZING RADIATION UPON INTEGRAL MICROCIRCUIT ON COMPLEMENTARY METAL- OXIDE-SEMICONDUCTOR STRUCTURES
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机译:互补金属氧化物-半导体材料结构上的积分微电路脉动电离辐射建模方法
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摘要
FIELD: electronic engineering. SUBSTANCE: method involves applying modeling pulsating ionizing radiation only to test sample of integral microcircuit on complementary metal-oxide-semiconductor structures randomly selected from a lot of integral microcircuits under test. Amplitude and time parameters of pulsating electric current in sample power supply circuit. Pulsating voltage is supplied to sublayer of every complementary metal-oxide- semiconductor integral microcircuit under test. Voltage amplitude, shape and duration are selected so that electric current in feeding circuit of complementary metal-oxide-semiconductor integral microcircuit coincide with amplitude and time parameters of electric current in test sample power supply circuit, recorded in irradiating it with pulsating ionizing radiation of modeling device. EFFECT: enhanced effectiveness and low cost of modeling. 4 dwg
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