首页> 外国专利> Information memory refresh device testing method - verifies initial condition of each selected memory cell before switching cell condition using test cycle of resetting memory and subsequent verification of new memory cell conditions

Information memory refresh device testing method - verifies initial condition of each selected memory cell before switching cell condition using test cycle of resetting memory and subsequent verification of new memory cell conditions

机译:信息存储器刷新设备测试方法-使用重置存储器的测试周期以及随后对新存储单元条件的验证,在切换单元条件之前验证每个选定存储单元的初始条件

摘要

The testing method verifies the condition of the memory cells selected by a refresh selection device at the beginning of the test cycle, before switching the resetting memory, used for switching each selected memory cell into a fresh condition, into a test mode , with subsequent verification of the new condition of each memory cell. The verification of the original condition of each selected memory cell may be effected by entering a given information in the selected memory cells, causing each selected cell to have the same initial condition, the test mode of the resetting device switching all the selected memory cells into a second condition.
机译:该测试方法在测试周期开始时验证刷新选择设备选择的存储单元的状态,然后将用于将每个所选存储单元切换到新状态的复位存储器切换到测试模式,然后进行验证每个存储单元的新条件。可以通过在选择的存储单元中输入给定信息,使每个选择的单元具有相同的初始条件,来实现对每个选择的存储单元的原始状态的验证,重置设备的测试模式将所有选择的存储单元切换为第二个条件。

著录项

  • 公开/公告号DE10004958A1

    专利类型

  • 公开/公告日2001-08-09

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2000104958

  • 发明设计人 RICHTER DETLEV;SPIRKL WOLFGANG;

    申请日2000-02-04

  • 分类号G11C29/00;G11C11/406;

  • 国家 DE

  • 入库时间 2022-08-22 01:09:59

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