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Error correcting circuit for making efficient error correction, and involatile semiconductor memory device incorporating the same error correcting circuit

机译:用于有效地进行纠错的纠错电路以及具有该纠错电路的非易失性半导体存储装置

摘要

This invention provides a nonvolatile semiconductor memory device capable of avoiding complicatedness of algorithm for normal write operation and a write operation prior to erasing in a memory system in which the distribution of threshold of cells after erasing is adjusted. This nonvolatile semiconductor memory device generates check bits as error correction code according to a check bit generating matrix so formed that in both the normal write operation and the write operation prior to erasing, the factors of “1” of respective rows satisfy the quantity absolutely necessary for generating check bits and the quantity of the factors of “1” is an odd number.
机译:本发明提供了一种非易失性半导体存储器件,该非易失性半导体存储器件能够避免在调整了擦除之后的单元的阈值的分布的存储系统中进行通常的写入操作和擦除之前的写入操作的算法的复杂性。该非易失性半导体存储器件根据校验位生成矩阵来生成校验位作为纠错码,该校验位生成矩阵被形成为使得在正常写入操作和擦除之前的写入操作中,因子“ 1”等于1。相应行的“绝对”满足生成校验位绝对必要的数量和“ 1”因子的数量。是一个奇数。

著录项

  • 公开/公告号US2001003510A1

    专利类型

  • 公开/公告日2001-06-14

    原文格式PDF

  • 申请/专利权人 KABUSHIKI KAISHA TOSHIBA;

    申请/专利号US20000732478

  • 发明设计人 NOZOMI KASAI;TAKAMICHI KASAI;

    申请日2000-12-07

  • 分类号G11C11/34;

  • 国家 US

  • 入库时间 2022-08-22 01:07:33

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