The field-programmable gate arrays (FPGAs) are widely used in varies fields in recent years. However, because of large amounts of configuration memories in FPGAs are used to implement logic and routing, the single event upset (SEU) problem makes them not feasible for applications that need high reliability. Moreover, as the threshold voltage becomes lower with the development of silicon process technology, the configuration memories are becoming more sensitive to SEU. Therefore, FPGAs require new technology to improve its dependability. In this research, we first develop a new Hamming code based error detect and correct (EDC) circuit that can prevent the configuration memory of a reconfigurable device from SEU. We then propose a novel reconfigurable logic element, namely COGRE, which will use much less configuration memory than the conventional FPGA 4-, 5- or 6-LUTs (lookup tables). Evaluation revealed that compared to the 6-LUT FPGAs with triple modular redundancy (TMR) configuration memory blocks, the 5- and 6-input COGRE with the novel error detect and correct circuit save about 75.44 and 74.29% memories on average, respectively. And the dependability of the proposed architectures is about 6.8 to 10 times better than the LUTs with a tile level TMR structure on average. Moreover, with the consideration of the on the fly scrubbing advantage of the EDC, SEUs cannot be accumulated, so a much higher dependability can be achieved.
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