首页> 外国专利> ERROR DETECTING AND CORRECTING CIRCUIT USING CHIEN SEARCH, SEMICONDUCTOR MEMORY CONTROLLER INCLUDING ERROR DETECTING AND CORRECTING CIRCUIT, SEMICONDUCTOR MEMORY SYSTEM INCLUDING ERROR DETECTING AND CORRECTING CIRCUIT, AND ERROR DETECTING AND CORRECTING METHOD USING CHIEN SEARCH

ERROR DETECTING AND CORRECTING CIRCUIT USING CHIEN SEARCH, SEMICONDUCTOR MEMORY CONTROLLER INCLUDING ERROR DETECTING AND CORRECTING CIRCUIT, SEMICONDUCTOR MEMORY SYSTEM INCLUDING ERROR DETECTING AND CORRECTING CIRCUIT, AND ERROR DETECTING AND CORRECTING METHOD USING CHIEN SEARCH

机译:使用chien搜索的错误检测和纠正电路,包括错误检测和纠正电路的半导体存储器控制器,包括错误检测和纠正电路的半导体存储器系统以及使用chien搜索的错误检测和纠正方法

摘要

An error detecting and correcting circuit is provided with a syndrome calculating circuit calculating a syndrome of an inputted data sequence including an error correcting code, a polynomial deriving circuit deriving an error location polynomial, a Chien searching circuit obtaining a location of error data of the data sequence, and an error correcting circuit correcting an error of the data, and every time the Chien searching circuit specifies the location of error data, the error correcting circuit immediately corrects the error of the data at the error location, and outputs the corrected data to an external circuit, thereby the error can be efficiently detected and corrected.
机译:检错校正电路具有校正子计算电路,校正子计算电路计算包括纠错码的输入数据序列的校正子,多项式推导电路得出误差位置多项式,Chien搜索电路获得数据的错误数据的位置顺序和纠错电路纠正数据的错误,并且每当Chien搜索电路指定错误数据的位置时,纠错电路立即在错误位置纠正数据的错误,并将纠正后的数据输出到外部电路,从而可以有效地检测和纠正错误。

著录项

  • 公开/公告号US2009106634A1

    专利类型

  • 公开/公告日2009-04-23

    原文格式PDF

  • 申请/专利权人 HIROAKI MURAOKA;

    申请/专利号US20080245063

  • 发明设计人 HIROAKI MURAOKA;

    申请日2008-10-03

  • 分类号H03M13/15;G06F11/10;

  • 国家 US

  • 入库时间 2022-08-21 19:34:38

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