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Method for fabricating MOS transistor having raised source and drain

机译:具有升高的源极和漏极的mos晶体管的制造方法

摘要

A process for fabricating a semiconductor device comprising a raised source and drain. A semiconductor device is fabricated by a process comprising the following steps: forming active regions separated by isolation regions; forming at each active region a gate electrode structure; depositing a first dielectric layer and a second dielectric layer; removing the top portion of the second dielectric layer to expose the portion of the first dielectric layer that covers the gate electrode structure; forming on the substrate a patterned resist layer to mask portions of the second dielectric layer; forming trenches next to the gate electrode structure by removing the unmasked portions of the second dielectric layer; filling the trenches with a conductor; doping the conductor with dopants; and driving the dopants into the substrate to form the raised source and drain.
机译:一种制造包括凸起的源极和漏极的半导体器件的方法。通过包括以下步骤的工艺来制造半导体器件:形成由隔离区分开的有源区;以及形成由隔离区隔开的有源区。在每个有源区形成栅电极结构;沉积第一介电层和第二介电层;去除第二介电层的顶部,以暴露出第一介电层的覆盖栅电极结构的部分;在基板上形成图案化的抗蚀剂层以掩盖第二介电层的部分;通过去除第二介电层的未掩蔽部分在栅电极结构旁边形成沟槽;用导体填充沟槽;用掺杂剂掺杂导体;并将掺杂剂驱入衬底中以形成凸起的源极和漏极。

著录项

  • 公开/公告号US6150244A

    专利类型

  • 公开/公告日2000-11-21

    原文格式PDF

  • 申请/专利权人 MOSEL VITELIC INC.;

    申请/专利号US19990467086

  • 发明设计人 CHENG-TSUNG NI;

    申请日1999-12-10

  • 分类号H01L21/22;

  • 国家 US

  • 入库时间 2022-08-22 01:06:31

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