Method of driving electron-emitting device, method of driving electron source using the electron-emitting device, and method of driving image forming apparatus using the electron source

摘要

An emission current (Ie1) emitted by the electron-emitting device and/or a device current (If1) flowing through the electron-emitting device are measured when a voltage (V1) is applied to the electron-emitting device and an emission current (Ie2) emitted by the electron-emitting device and/or a device current (If2) flowing through the electron-emitting device are measured when the voltage (V1) is applied to the electron-emitting device after the measurement step. A voltage (V2) higher than the voltage (V1) is applied to the electron-emitting device when the emission current (Ie2) is larger than the emission current (Ie1) and/or the device current (If2) is larger than the device current (If1).