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Semiconductor material classification device

机译：半导体材料分类装置

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摘要

A device for the optoelectronic classification of semiconductor materials, which has an identifying device 6 that forwards the morphology of the product 1 to be classified to an evaluating device 7 which evaluates the data.

机译：一种用于半导体材料光电分类的设备，该设备具有识别设备 6 ，该设备将要分类的产品 1 的形态转发到评估设备 7 < / B>评估数据。 展开▼

著录项

公开/公告号US6265683B1

专利类型

公开/公告日2001-07-24

原文格式PDF

申请/专利权人 WACKER-CHEMIE GMBH;
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申请/专利号US19990388207

发明设计人 MATTHAUML;US SCHANTZ;KARL HESSE;DIRK FLOTTMANN;
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申请日1999-09-01

分类号B07C50/00;

国家 US

入库时间 2022-08-22 01:03:46

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