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Diffraction efficiency measuring method and diffraction efficiency measurement equipment

机译:衍射效率测量方法和衍射效率测量设备

摘要

PROBLEM TO BE SOLVED: To shorten the time measuring for the diffraction efficiency not dependent on the aberration with a diffraction optical element such as hologram objective lens for use in an optical head, and make the light spot evaluation of the condensing performance as an optical component. ;SOLUTION: The emitted light from a semiconductor laser 11 is made a parallel light flux by a collimator lens 31 and cast on a hologram element so that a diffraction is generated. A desired diffracted light is condensed by a condenser lens and passed through a microscope 51, and the quantity of diffraction light is measured by a photo-quantity sensing means 41 through utilization of eclipse of unnecessarily diffracted light flux and enlargement of the condensed image of the desired diffracted light. Addition of a light spot observing means will permit accomplishment of a still more precise measurement to be conducted while the condensation spot performance is evaluated.;COPYRIGHT: (C)1997,JPO
机译:解决的问题:缩短用于衍射头的,不依赖于像差的衍射效率的测量时间,该衍射光学元件例如用于光学头的全息物镜,并且对作为光学部件的聚光性能进行光斑评估。 。 ;解决方案:通过准直透镜31使半导体激光器11发出的光成为平行光束,并投射在全息元件上,从而产生衍射。所需的衍射光通过聚光透镜会聚并通过显微镜51,并且通过利用不必要地衍射的光通量的月蚀和放大的聚光图像,由光量感测装置41测量衍射光的量。所需的衍射光。增设光点观测装置将可以在评估凝结点性能的同时完成更精确的测量。版权所有:(C)1997,日本特许厅

著录项

  • 公开/公告号JP3334470B2

    专利类型

  • 公开/公告日2002-10-15

    原文格式PDF

  • 申请/专利权人 松下電器産業株式会社;

    申请/专利号JP19960005371

  • 发明设计人 金馬 慶明;桑本 晋一;

    申请日1996-01-17

  • 分类号G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:01:34

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