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SINGLE-CRYSTAL X-RAY DIFFRACTION SYSTEM

机译:单晶X射线衍射系统

摘要

PROBLEM TO BE SOLVED: To provide a highly accurate angle selling method by which the cutting azimuth angle of a plurality of piezoelectric single crystals and a large-diameter Si ingot can be independently and highly accurately set and easily adapting to the the peeling of wafers after cutting can be easily performed.;SOLUTION: Incident X-rays 203 of Kα of copper Cu from an X-ray tube 201 are passed through a slit 202, a reflected by a crystal surface (r) of a lumbered quartz crystal 220 at a point of incidence 204, and enter a scintillation counter 214 which is an X-ray detecting part as reflected X-rays 213. In the lumbered qualtz crystal 206 (207), a UV-setting-type adhesive 208 is applied to a silica glass substrate 205, and the silica glass substrate 205 is mounted to a reference board 228. For adhering a mechanism for determining the target angle of the lumbered qualtz crystal 206 and the lumbered qualtz crystal 206 on the reference board 228, an adhesion fixed area 211 of ϕ20 mm is irradiated, from above the lumbered qualtz crystal 206 for ten seconds, with ultraviolet rays of which the waves are guided by a guide 210 for transmitting ultraviolet rays connected to an ultraviolet generating source 209 and hardened.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种高精度的角度销售方法,通过该方法可以独立,高精度地设置多个压电单晶和大直径硅锭的切割方位角,并易于适应晶片剥离后的剥离。解决方案:K&alpha的X射线入射203。来自X射线管201的铜Cu穿过狭缝202,在入射点204被a木石英220的晶体表面(r)反射,并进入闪烁计数器214,该计数器是X-射线检测部分作为反射的X射线213。在木料化的夸脱晶体206(207)中,将紫外线定型粘合剂208涂覆到石英玻璃基板205上,并将石英玻璃基板205安装到基准板228上。为了在基准基板228上粘贴用于确定木方石英晶体206和木方石英晶体206的目标角度的机构,从木方石英晶体206的上方照射φ20mm的附着固定区域211,持续10次。紫外线;其紫外线由连接到紫外线发生源209并硬化的用于引导紫外线的波导210引导。;版权:(C)2002,JPO

著录项

  • 公开/公告号JP2002318209A

    专利类型

  • 公开/公告日2002-10-31

    原文格式PDF

  • 申请/专利权人 WATANABE TAKAYA;

    申请/专利号JP20010161467

  • 发明设计人 WATANABE TAKAYA;

    申请日2001-04-20

  • 分类号G01N23/207;

  • 国家 JP

  • 入库时间 2022-08-22 00:55:59

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