METHOD FOR DESIGNING SEMICONDUCTOR DEVICE, METHOD FOR FORMING CHECK PATTERN OF THE SEMICONDUCTOR DEVICE, METHOD FOR CHECKING THE SEMICONDUCTOR DEVICE AND SYSTEM FOR DESIGNING THE SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To improve efficiency in function check of LSI's and the like.;SOLUTION: Several scan circuits are buried in a logic circuit and a circuit block, sandwiched between an input terminal or a scan circuit on the input side and an output terminal or a scan circuit on the output side is formed (step 11). Then giving attention is one circuit block, a first input pattern necessary for checking its functions is formed (step 12). The first input pattern is formed repeatedly, until the first circuit block of interest runs out (step 16). The number of patterns of the input patterns, having maximum pattern number is found out of the formed group of the first input patterns (step 17). Then the number of stages of scan chains is found from the maximum number of patterns (step 18). The number of scan chains is found from the number of stages of the scan chains (step 19). A chain of scan circuits is formed for filling the conditions of number of stages of the scan chains and the number of scan chains (step 20).;COPYRIGHT: (C)2002,JPO