首页> 外国专利> SLURRY, GRINDSTONE, PAD AND ABRASIVE FLUID FOR MIRROR POLISHING OF SILICON WAFER, AND MIRROR POLISHING METHOD USING THESE MATERIALS

SLURRY, GRINDSTONE, PAD AND ABRASIVE FLUID FOR MIRROR POLISHING OF SILICON WAFER, AND MIRROR POLISHING METHOD USING THESE MATERIALS

机译:硅晶片镜面抛光的浆液,砂石,PAD和研磨液以及使用这些材料的镜面抛光方法

摘要

PROBLEM TO BE SOLVED: To provide slurry, a grindstone, a pad and abrasive fluid for mirror polishing of a silicon wafer, and a polishing method for the silicon wafer using these materials, by which a mirror polishing speed is remarkably improved, a mirror finished surface is obtained for a short time and a throughput is further improved.;SOLUTION: The slurry, the grindstone, the pad and the abrasive fluid for mirror polishing of the silicon wafer are constituted so that fine grains of an alkali earth metal carbonate as abrasive grains may contain a water-soluble carbonate as an abrasive accelerator. In the polishing method of the silicon wafer, the fine grains of the alkali earth metal carbonate is used as the abrasive grains, and wet polishing is carried out in the presence of water and the water- soluble carbonate.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:为了提供用于硅晶片的镜面抛光的浆料,砂轮,抛光垫和研磨液,以及使用这些材料的硅晶片的抛光方法,通过这些材料可以显着提高镜面抛光的速度,从而完成镜面加工。解决方案:构成硅晶片的镜面抛光用的浆料,砂轮,抛光垫和研磨液,使碱土金属碳酸盐的细粒作为研磨剂颗粒可能包含水溶性碳酸盐作为研磨促进剂。在硅晶片的抛光方法中,将碱土金属碳酸盐的细颗粒用作磨料颗粒,并在水和水溶性碳酸盐的存在下进行湿法抛光。;版权所有:(C)2002 ,日本特许厅

著录项

  • 公开/公告号JP2002292556A

    专利类型

  • 公开/公告日2002-10-08

    原文格式PDF

  • 申请/专利权人 SUMITOMO OSAKA CEMENT CO LTD;

    申请/专利号JP20010097070

  • 发明设计人 KINOSHITA NOBORU;YAMAMOTO YOSHITAKA;

    申请日2001-03-29

  • 分类号B24B37/00;B24B37/04;B24D3/00;B24D3/02;C09K3/14;H01L21/304;

  • 国家 JP

  • 入库时间 2022-08-22 00:55:11

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