首页> 外国专利> POLISHING PLATE FOR MIRROR POLISHING SILICON WAFER AND METHOD FOR MIRROR POLISHING SILICON WAFER

POLISHING PLATE FOR MIRROR POLISHING SILICON WAFER AND METHOD FOR MIRROR POLISHING SILICON WAFER

机译:用于镜面抛光硅晶片的抛光板和用于镜面抛光硅晶片的方法

摘要

PROBLEM TO BE SOLVED: To provide a polishing plate for mirror polishing a silicon wafer having a small surface roughness unevenness in a surface of the wafer, that is, excellent mirror polishing uniformity and a method for mirror polishing the wafer.;SOLUTION: The polishing plate for mirror polishing the silicon wafer comprises a plastic plate in which the overall contact surface area with the polishing surface of the wafer is substantially uniformly roughed. The method for mirror polishing the silicon wafer comprises the steps of fixing the polishing plate for mirror polishing the wafer onto a surface plate of a polishing unit or a lapping unit, and mirror polishing the wafer while supplying a polishing agent slurry between the wafer and the polishing plate.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种用于对硅晶片进行镜面抛光的抛光板,该硅晶片在晶片表面具有小的表面粗糙度不均匀性,即优异的镜面抛光均匀性,以及一种镜面抛光晶片的方法。用于硅晶片的镜面抛光的板包括塑料板,其中与晶片的抛光表面的总接触表面积基本上均匀地粗糙化。镜面抛光硅晶片的方法包括以下步骤:将用于镜面抛光晶片的抛光板固定到抛光单元或研磨单元的面板上;镜面抛光晶片,同时在晶片和晶片之间提供抛光剂浆料。抛光板。;版权:(C)2002,日本特许厅

著录项

  • 公开/公告号JP2002158196A

    专利类型

  • 公开/公告日2002-05-31

    原文格式PDF

  • 申请/专利权人 SUMITOMO OSAKA CEMENT CO LTD;

    申请/专利号JP20000349882

  • 发明设计人 KINOSHITA NOBORU;YAMAMOTO YOSHITAKA;

    申请日2000-11-16

  • 分类号H01L21/304;B24B37/00;B24B53/12;

  • 国家 JP

  • 入库时间 2022-08-22 00:55:01

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