首页> 外国专利> FIXED ABRASIVE GRAIN POLISHING PAD, AND METHOD OF POLISHING SILICON WAFER USING FIXED ABRASIVE GRAIN POLISHING PAD

FIXED ABRASIVE GRAIN POLISHING PAD, AND METHOD OF POLISHING SILICON WAFER USING FIXED ABRASIVE GRAIN POLISHING PAD

机译:固定磨粒抛光垫以及使用固定磨粒抛光垫抛光硅晶片的方法

摘要

PROBLEM TO BE SOLVED: To provide a fixed abrasive grain polishing pad and a method of polishing a silicon wafer using the fixed abrasive grain polishing pad prevented from the detachment of abrasive grains and improved in polishing efficiency.;SOLUTION: This fixed abrasive grain polishing pad for polishing the silicon wafer by relative motion to the silicon wafer by pressing the silicon wafer while supplying an alkaline solution as a polishing fluid between the silicon wafer and the polishing pad, is composed of at least a polyurethane binder comprising a hard segment and a soft segment, and abrasive grains having a hydroxyl group, or abrasive grains supplied with the hydroxyl group, wherein the molecular weight of the hard segment is in a range of 20% to 60% of the whole at a molecular weight ratio.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种固定的磨粒抛光垫以及使用该固定的磨粒抛光垫来抛光硅晶片的方法,该方法防止磨粒的脱离并提高抛光效率。通过在按压硅晶片的同时相对于硅晶片相对运动来研磨硅晶片,同时在硅晶片和抛光垫之间提供作为研磨液的碱性溶液,其至少由包括硬链段和软链段的聚氨酯粘合剂组成。链段,具有羟基的磨粒或带有羟基的磨粒,其中硬链段的分子量以分子量比为整体的20%至60%。 C)2005,日本特许厅

著录项

  • 公开/公告号JP2004337992A

    专利类型

  • 公开/公告日2004-12-02

    原文格式PDF

  • 申请/专利权人 DISCO ABRASIVE SYST LTD;

    申请/专利号JP20030133965

  • 发明设计人 TSUMAGARI AKIO;MIYAZAKI KAZUYA;

    申请日2003-05-13

  • 分类号B24D11/00;B24D3/00;B24D3/28;C09K3/14;H01L21/304;

  • 国家 JP

  • 入库时间 2022-08-21 22:31:15

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号