首页> 外国专利> Semiconductor device having gate-gate, drain-drain, and drain-gate connecting layers and method of fabricating the same

Semiconductor device having gate-gate, drain-drain, and drain-gate connecting layers and method of fabricating the same

机译:具有栅极-栅极,漏极-漏极和漏极-栅极连接层的半导体器件及其制造方法

摘要

A semiconductor memory device comprising first and second gate-gate connecting layers, first and second drain-drain connecting layers, and first and second drain-gate connecting layers. The first and second gate-gate connecting layers respectively connect a gate of a driver transistor to a gate of a load transistor. The first and second drain-drain connecting layers are formed over a first interlayer dielectric and have a refractory metal nitride layer. The first and second drain-drain connecting layers respectively connect a drain of the driver transistor to a drain of the load transistor. The first and second drain-gate connecting layers are formed over a second interlayer dielectric, and respectively connect the first drain-drain connecting layer to the second gate-gate connecting layer, and the second drain-drain connecting layer to the first gate-gate connecting layer.
机译:一种半导体存储器件,包括第一和第二栅极-栅极连接层,第一和第二漏极-漏极连接层以及第一和第二漏极-栅极连接层。第一和第二栅极-栅极连接层分别将驱动器晶体管的栅极连接到负载晶体管的栅极。第一和第二漏极-漏极连接层形成在第一层间电介质上方并且具有难熔金属氮化物层。第一和第二漏极-漏极连接层分别将驱动器晶体管的漏极连接到负载晶体管的漏极。第一和第二漏极-栅极连接层形成在第二层间电介质上,并且分别将第一漏极-漏极连接层连接到第二栅极-栅极连接层,并且将第二漏极-漏极连接层分别连接到第一栅极-栅极。连接层。

著录项

  • 公开/公告号US06437455B1

    专利类型

  • 公开/公告日2002-08-20

    原文格式PDF

  • 申请/专利权人

    申请/专利号US09758390

  • 申请日2001-01-12

  • 分类号H01L271/10;

  • 国家 US

  • 入库时间 2022-08-22 00:53:06

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