Integrated semiconductor device with wafer-level burn-in circuit and function decision method of wafer-level burn-in circuit

摘要

An integrated semiconductor device with a wafer-level burn-in circuit includes a test mode register and an access controller. The integrated semiconductor device is set at a voltage force mode by placing the test mode register at a test mode, and is forcedly supplied with prescribed voltages. The wafer-level burn-in is carried out by setting an access controller at a WLBI (wafer-level burn-in) mode with maintaining the test mode. After completing the wafer-level burn-in operation, the WLBI mode is released. Then, an external tester reads test data from a memory core in the test mode, and compares the test data with expected values. The integrated semiconductor device with a wafer-level burn-in circuit can solve a problem of a conventional integrated semiconductor device with a wafer-level burn-in circuit in that it cannot verify the function of the wafer-level burn-in circuit properly.