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The substrate the Pt thin film and use that thin film which is unified heater, the temperature detection component and the gas sensor

机译:基板为Pt薄膜并使用该薄膜为一体的加热器,温度检测元件和气体传感器

摘要

PURPOSE: To prevent the occurrence of a film exfoliation trouble by securing adhesive strength by controlling the structure of a Pt thin film when a Pt thin film resistor is used as a micro-sensor. ;CONSTITUTION: The thin film has the degree of orientation, defined by the formula I mentioned separately, of 60% or higher and the size of crystallite, computed by the Scherrer's formula defined by the formula II, of 0.01μm or higher. In the formula I(111), the (111) surface diffraction strength ΣI (hk1) in an XRD measurement indicates the sum of intensity of all diffraction intensity measured in the range of measurement, Dhkl indicates the size (Å) of the crystallite in vertical direction to the (hk1) surface, (λ) indicates the wavelength (Å) of X-rays, (β) indicates the width of diffraction beam (rad), (θ) indicates diffraction angle (degree), and (K) indicates a constant of 0.9. As a result, the adhesive strength of the Pt thin film is increased, and a strong thin film resistor can be obtained.;COPYRIGHT: (C)1995,JPO
机译:目的:当将Pt薄膜电阻器用作微传感器时,通过控制Pt薄膜的结构来确保粘合强度,从而防止出现膜剥落问题。组成:薄膜具有分别由式I定义的取向度为60%或更高,并且由由式II定义的Scherrer公式计算的微晶尺寸为0.01μm或更高。在式I(111)中,XRD测量中的(111)表面衍射强度&SigmaI(hk1)表示在测量范围D hkl 中测量的所有衍射强度的强度之和。表示微晶在与(hk1)表面垂直的方向上的尺寸(&),(λ)表示X射线的波长(&),(β)表示衍射束的宽度(rad), (θ)表示衍射角(度),(K)表示常数0.9。结果,增加了Pt薄膜的粘合强度,并且可以获得坚固的薄膜电阻器。; COPYRIGHT:(C)1995,JPO

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