首页> 外国专利> METHOD FOR CONTROLLING INITIAL GROWTH OF COPPER FILM BY CHEMICAL VAPOR DEPOSITION (CVD) USING SURFACE TREATMENT ON BARRIER METAL FILM

METHOD FOR CONTROLLING INITIAL GROWTH OF COPPER FILM BY CHEMICAL VAPOR DEPOSITION (CVD) USING SURFACE TREATMENT ON BARRIER METAL FILM

机译:阻挡金属膜表面处理化学气相沉积(CVD)控制铜膜初始生长的方法

摘要

PROBLEM TO BE SOLVED: To provide a method for forming a copper film on barrier metal so that excellent properties of trench filling and step coverage are provided.;SOLUTION: The chemical vapor deposition (CVD) method for copper films involves a process, including a process wherein a structure containing barrier metal and with the surface of the barrier metal exposed is formed on a substrate, in which the substrate is prepared; a process in which the prepared substrate is placed in a CVD chamber; a process in which the substrate is heated to a temperature of approx. 200°C to 250°C; a process in which a flow of water is let in carrier gas for at least one minute; a process in which the flow of water is stopped; and a process in which a flow of precursor of copper is started.;COPYRIGHT: (C)2003,JPO
机译:要解决的问题:提供一种在势垒金属上形成铜膜的方法,从而提供优异的沟槽填充和台阶覆盖性能。解决方案:用于铜膜的化学气相沉积(CVD)方法涉及一个工艺,包括方法,其中在衬底上形成包含阻挡金属并暴露出阻挡金属表面的结构,其中准备了衬底;将准备好的衬底放置在CVD室中的过程;将衬底加热到​​约200℃的温度的过程。 200°C至250°C;使载气流中的水流至少一分钟的过程;停止水流的过程;铜的前驱物开始流动的过程。版权所有:(C)2003,日本特许厅

著录项

  • 公开/公告号JP2003124145A

    专利类型

  • 公开/公告日2003-04-25

    原文格式PDF

  • 申请/专利权人 SHARP CORP;

    申请/专利号JP20020245568

  • 发明设计人 PAN WEI;SHIEN TEN SUU;EVANS DAVID RUSSELL;

    申请日2002-08-26

  • 分类号H01L21/285;C23C16/06;H01L21/3205;

  • 国家 JP

  • 入库时间 2022-08-22 00:14:15

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