首页> 外国专利> X-RAY DIFFRACTION METHOD AND NEUTRON BEAM DIFFRACTION METHOD

X-RAY DIFFRACTION METHOD AND NEUTRON BEAM DIFFRACTION METHOD

机译:X射线衍射法和中子束衍射法

摘要

PROBLEM TO BE SOLVED: To provide an X-ray or neutron beam diffraction method capable of measuring a spatial reciprocal lattice in a membrane or the like in a non- destructive manner without missing the same to perform the identification of an unknow phase or the recognition of the presence of a twin crystal. SOLUTION: When the reciprocal lattice point in a sample is measured by the X-ray diffraction method, X-ray diffraction, which is equipped with four movable axes comprising a 2 axis being the angle form by incident X-rays and diffracted X-rays, a axis being the angle formed by incident X-rays and the sample, a axis being a tilt angle in the direction vertical to the incident direction of X-rays and a * axis being the in-plane angle of rotation of the sample, is used, and the 2 axis and the axis are coupled to scan a constant angle section and, subsequently, the axis is shifted to scan the constant angle section while again coupling the 2 axis and the axis. This operation is repeated up to the maximum angle of 90 deg. to measure the reciprocal lattice point and, during this measurement, the * axis is rotated at a high speed.
机译:解决的问题:提供一种X射线或中子束衍射方法,该方法能够以非破坏性的方式测量膜等中的空间倒易晶格,而不会丢失该X晶或中子束,以执行未知相的识别或识别。双晶的存在。解决方案:当通过X射线衍射法测量样品中的倒数晶格点时,X射线衍射具有四个可移动轴,其中两个轴是入射X射线和衍射X射线形成的角度形式,轴是由入射的X射线与样本形成的角度,轴是在垂直于X射线的入射方向的方向上的倾斜角,*轴是样本的面内旋转角,使用“ 1”时,将2轴和该轴耦合以扫描恒定角度部分,随后,将该轴移动以扫描该恒定角部分,同时再次耦合2轴和该轴。重复此操作直至最大90度角。测量倒数晶格点,并且在此测量过程中,*轴高速旋转。

著录项

  • 公开/公告号JP2003098124A

    专利类型

  • 公开/公告日2003-04-03

    原文格式PDF

  • 申请/专利权人 RIKOGAKU SHINKOKAI;

    申请/专利号JP20010289460

  • 发明设计人 SAEKI ATSUSHI;

    申请日2001-09-21

  • 分类号G01N23/20;G01N23/204;G21K1/06;

  • 国家 JP

  • 入库时间 2022-08-22 00:12:42

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号