首页> 外国专利> CMOS OUTPUT DRIVER FOR SEMICONDUCTOR DEVICE AND RELATED METHOD FOR IMPROVING LATCH-UP IMMUNITY IN A CMOS OUTPUT DRIVER

CMOS OUTPUT DRIVER FOR SEMICONDUCTOR DEVICE AND RELATED METHOD FOR IMPROVING LATCH-UP IMMUNITY IN A CMOS OUTPUT DRIVER

机译:用于半导体器件的CMOS输出驱动器以及提高CMOS输出驱动器中的闩锁免疫性的相关方法

摘要

An output driver circuit for a semiconductor device. In one embodiment, the output driver is coupled to an output terminal of the semiconductor device and consists of an N-channel pull-down transistor and a P-channel pull-up transistor formed in an N-well in a P-type substrate. A tie-down region formed in the N-well is selectively coupled to a supply potential by means of a decoupling transistor, and during normal operation of the driver maintains the supply voltage bias of the N-well. An overdrive detection circuit is coupled to the output terminal. Upon detection of an overdrive condition on the output terminal, such as a voltage exceeding a predetermined maximum, or excessive current injected into the output terminal (or both), the overdrive detection circuit deasserts a control signal applied to the gate of the decoupling transistor, thereby decoupling the N-well from the supply potential. In one embodiment, the decoupling transistor is not coupled to the output terminal.
机译:用于半导体器件的输出驱动器电路。在一个实施例中,输出驱动器耦合到半导体器件的输出端子,并且由形成在P型衬底的N阱中的N沟道下拉晶体管和P沟道上拉晶体管组成。形成在N阱中的束缚区通过去耦晶体管选择性地耦合到电源电位,并且在驱动器的正常操作期间,保持N阱的电源电压偏置。过驱动检测电路耦合到输出端子。在检测到输出端子上的过驱动情况时,例如超过预定最大值的电压,或注入到输出端子(或两者)的电流过大,过驱动检测电路将取消施加到去耦晶体管栅极的控制信号置为无效,从而将N阱与电源电位去耦。在一实施例中,去耦晶体管不耦接至输出端子。

著录项

  • 公开/公告号US2003107406A1

    专利类型

  • 公开/公告日2003-06-12

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US20010010820

  • 发明设计人 MANNY K. MA;WEN LI;MICHAEL D. CHAINE;

    申请日2001-12-06

  • 分类号H03K19/0175;

  • 国家 US

  • 入库时间 2022-08-22 00:12:07

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