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Latch-up immune CMOS output driver

机译:闩锁免疫CMOS输出驱动器

摘要

An output driver for a CMOS circuit minimizes latch-up. A P-channel transistor (14) has its source-drain path coupled in series with the source-drain path of one or more N-channel transistors (16, 12). An internally generated high voltage VCCP, higher than VCC, is applied to the moat, well, or region (32) in which the P-channel transistor (14) is formed, and is applied to the gate electrode (26, 42) of the N - channel transistor(s). In one embodiment the source electrode (34) of the P-channel transistor (14) is connected directly to VCC whereas in another embodiment , it is coupled to the source-drain path of another N-channel transistor (12), the gate electrode (26) of which is coupled to the high voltage VCCP. In such second embodiment, the drain electrode (24) of the other N-channel transistor (12) is coupled to VCC, so that the P-channel transistor is in series between the two N-channel transistors (12,16). One of the N-channel FETs (12, 16) may receive at its gate electrode (26, 42) either a constant high voltage (VCCP) despite changes in the logic state of the data input signal, or it may correspond inversely therewith.
机译:CMOS电路的输出驱动器使闩锁最小化。 P沟道晶体管(14)的源极-漏极路径与一个或多个N沟道晶体管(16、12)的源极-漏极路径串联耦合。将内部产生的高于VCC的高压VCCP施加到形成P沟道晶体管(14)的at沟,阱或区域(32),并施加到栅极的栅极(26、42)上N-沟道晶体管。在一个实施例中,P沟道晶体管(14)的源电极(34)直接连接至VCC,而在另一实施例中,其耦合至另一N沟道晶体管(12)的源-漏路径,即栅极(26)耦合到高压VCCP。在这样的第二实施例中,另一个N沟道晶体管(12)的漏极(24)耦合到VCC,使得P沟道晶体管串联在两个N沟道晶体管(12,16)之间。尽管数据输入信号的逻辑状态发生变化,N沟道FET之一(12、16)仍可以在其栅电极(26、42)处接收恒定的高电压(VCCP),或者可以与其相反地对应。

著录项

  • 公开/公告号EP0582767B1

    专利类型

  • 公开/公告日1996-12-18

    原文格式PDF

  • 申请/专利号EP19930100410

  • 发明设计人 HARDEE KIM C.;

    申请日1993-01-13

  • 分类号H03K19/003;

  • 国家 EP

  • 入库时间 2022-08-22 03:21:14

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