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Latch-up Reduction Output Driver and Latch-Up Reduction Method in CMOS (CMOS) Circuits

机译:CMOS(CMOS)电路中的闩锁减小输出驱动器和闩锁减小方法

摘要

The present invention relates to a latch-up reduction output driver and a latch-up reduction method of a CMOS circuit that minimizes latch-up. P-channel transistor 14 has its source-drain path connected in series with the source-drain path of one or more N-channel transistors 16,12. The internally generated high voltage VCCP higher than VCC is applied to the region 32 where the P-channel transistor 14 is formed, i. E., To the moat or well and also to the gate electrode 26, do. In an embodiment (FIG. 3), the source electrode 34 of the P-channel transistor 14 is connected directly to VCC, but in other embodiments (FIGS. 1a and 1b) 3 4 are connected to the source-drain path of another N-channel transistor 12 and the gate electrode 26 of this N-channel transistor 12 is connected to the high voltage VCCP. In this second embodiment, the drain electrode 24 of the other N-channel transistor 12 is connected to VCC such that a P-channel transistor is placed in series between the two N-channel transistors 12,16 do. One of the N-channel transistors 12 and 16 always supplies a high voltage VCCP (shown in FIG. 1A) or a corresponding reverse voltage (shown in FIG. 1B) to the gate electrode 26, /RTI
机译:本发明涉及使闩锁最小化的CMOS电路的闩锁减小输出驱动器和闩锁减小方法。 P沟道晶体管14的源极-漏极路径与一个或多个N沟道晶体管16,12的源极-漏极路径串联连接。内部产生的高于VCC的高电压VCCP被施加到形成P沟道晶体管14的区域32,即,形成在P沟道晶体管14上的区域。例如,对护城河或井,以及对栅电极26,做。在一个实施例中(图3),P沟道晶体管14的源极电极34直接连接到VCC,但是在其他实施例中(图1a和1b)3 4连接到另一个N的源极-漏极路径。沟道晶体管12和该N沟道晶体管12的栅电极26连接到高压VCCP。在该第二实施例中,另一个N沟道晶体管12的漏极24连接到VCC,使得P沟道晶体管串联地放置在两个N沟道晶体管12,16之间。 N沟道晶体管12和16之一始终向栅电极26提供高电压VCCP(图1A所示)或相应的反向电压(图1B所示),

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