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Semiconductor integrated circuit device capable of self-testing internal power supply currents provided to internal circuits integrated on chip
Semiconductor integrated circuit device capable of self-testing internal power supply currents provided to internal circuits integrated on chip
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机译:能够自我测试提供给集成在芯片上的内部电路的内部电源电流的半导体集成电路器件
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摘要
The semiconductor integrated circuit device includes an internal power supply circuit placed between a prescribed one of a plurality of internal circuits and a power supply interconnection for converting a level of an external power supply potential to supply an internal power supply potential to the prescribed internal circuit, and a control circuit for conducting a self-test of the semiconductor integrated circuit device. The control circuit detects a current amount being supplied from the internal power supply circuit to the prescribed internal circuit. The detected result is externally output via a data input/output unit.
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