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Method of manufacturing a polycrystalline silicon film and thin film transistor using lamp and laser anneal

机译:使用灯和激光退火制造多晶硅膜和薄膜晶体管的方法

摘要

An a-Si film (20) is formed so as to straddle a gate electrode (12) formed of high thermal conductive materials on a substrate (10) via a gate insulating film (14). The a-Si is subjected to an RTA process with the irradiation of a halogen lamp and a laser annealing process with the irradiation of an excimer laser to obtain a p-Si film (24) by polycrystallizing the a-Si film (20). By performing two types of annealing, uniform polycrystalline of grains with an appropriate size may be obtained, even over a region of the gate electrode (12) in the a-Si film (20). When the obtained p-Si film (24) is used as an active layer of TFT (a channel region), a polycrystalline silicon TFT with a bottom gate structure having excellent characteristics may be obtained.
机译:形成a-Si膜( 20 ),以使其跨越由高导热材料形成的栅电极( 12 )在衬底( 10 )通过栅绝缘膜( 14 )。通过对a-Si进行多晶化处理,使其在卤素灯的照射下进行RTA处理,并在受激准分子激光的照射下进行激光退火处理,从而得到p-Si膜( 24 )。 -Si膜( 20 )。通过进行两种退火,即使在a-Si膜( 20 12 )的整个区域上,也可以获得具有适当尺寸的均匀晶粒的多晶。 B>)。当将获得的p-Si膜( 24 )用作TFT的有源层(沟道区)时,可以获得具有优良特性的底栅结构的多晶硅TFT。

著录项

  • 公开/公告号US6569716B1

    专利类型

  • 公开/公告日2003-05-27

    原文格式PDF

  • 申请/专利权人 SANYO ELECTRIC CO. LTD.;SONY CORPORATION;

    申请/专利号US19980026968

  • 发明设计人 KOJI SUZUKI;

    申请日1998-02-20

  • 分类号H01L210/00;H01L218/40;

  • 国家 US

  • 入库时间 2022-08-22 00:06:29

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