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Semiconductor memory capable of debugging an incorrect write to or an incorrect erase from the same

机译:半导体存储器能够调试对同一存储器的不正确写入或不正确擦除

摘要

A command storing control circuit stores in storing units a plurality of commands supplied the latest of the supplied commands so as to execute the memory operation. A command reading control circuit reads the commands stored in a command storing area during a test mode. If incorrect data are written into a semiconductor memory, causing the system mounting the semiconductor memory to become inoperable, the cause of the trouble can be efficiently determined by utilizing the commands stored in the command storing area. As a result, the efficiency of development of the system can be improved, for example, and the cost of developing the system can be reduced. Moreover, the quality of the system can be also improved.
机译:命令存储控制电路在存储单元中存储最新提供的多个命令,以执行存储操作。命令读取控制电路在测试模式期间读取存储在命令存储区域中的命令。如果将错误的数据写入半导体存储器,导致安装半导体存储器的系统无法工作,则可以通过利用存储在命令存储区域中的命令来有效地确定故障原因。结果,例如,可以提高系统的开发效率,并且可以降低开发系统的成本。而且,系统的质量也可以提高。

著录项

  • 公开/公告号US6535442B2

    专利类型

  • 公开/公告日2003-03-18

    原文格式PDF

  • 申请/专利权人 FUJITSU LIMITED;

    申请/专利号US20010015597

  • 发明设计人 SHINSUKE KUMAKURA;

    申请日2001-12-17

  • 分类号G11C290/00;

  • 国家 US

  • 入库时间 2022-08-22 00:06:20

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