首页> 外国专利> In situ plasma pre-deposition wafer treatment in chemical vapor deposition technology for semiconductor integrated circuit applications

In situ plasma pre-deposition wafer treatment in chemical vapor deposition technology for semiconductor integrated circuit applications

机译:用于半导体集成电路的化学气相沉积技术中的原位等离子体预沉积晶片处理

摘要

A method of de-oxidizing a surface onto which a refractory metal or molecule which contains a refractory metal atom will be adhered. The method utilizes a plasma which includes a gas such as argon, nitrogen, helium or hydrogen, or a mixture of any of the foregoing, to remove oxygen molecules from the surface to which adherence of the refractory metal is desired. Radicals in the plasma coat the surface to prevent further oxidation thereof. The method also includes techniques for depositing refractory metals onto a surface such as a substrate or layer of semiconductor material on which integrated circuitry has been fabricated.
机译:一种将附着有难熔金属原子的难熔金属或分子粘附在其上的表面进行脱氧的方法。该方法利用等离子体,该等离子体包括诸如氩气,氮气,氦气或氢气之类的气体,或者前述任何一种的混合物,以从需要难熔金属附着的表面去除氧分子。等离子体中的自由基覆盖表面以防止其进一步氧化。该方法还包括用于将难熔金属沉积到诸如衬底或半导体材料层的表面上的技术,在该表面上已经制造了集成电路。

著录项

  • 公开/公告号US6515363B2

    专利类型

  • 公开/公告日2003-02-04

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US19990407334

  • 发明设计人 WEIMIN LI;

    申请日1999-09-29

  • 分类号H01L234/80;

  • 国家 US

  • 入库时间 2022-08-22 00:04:23

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