Two-output voltage test system

摘要

The disclosure provides a two-output voltage test system, wherein the system includes a plurality of D/A converters, buffers, sinusoidal wave generators, power amplifiers, and a micro-processing controller. The two-output voltage test system provides for a number of processes including one group of the plurality of D/A converters, buffers, sinusoidal wave generators, and power amplifiers to perform the measurement of AC voltage durability (W_AC), DC voltage durability (W_DC), insulation resistance (IR), and leakage current (LK). The other group of the plurality of D/A converters, buffers, sinusoidal wave generators, and power amplifiers performs the measurement of ground resistance (GR). The micro-processing controller outputs the measurements simultaneously or with slight time delay in order to obtain the results measured at the same time.