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CHEMICAL MECHANICAL POLISHING OF COPPER-OXIDE DAMASCENE STRUCTURES

机译:氧化铜镶嵌结构的化学机械抛光

摘要

Title: CHEMICAL MECHANICAL POLISHING OF COPPER-OXIDE DAMASCENE STRUCTURES[err]Abstract: A method of chemical mechanical polishing of a metal damascene structure which includes an insulation layer having trenches on a wafer and a metal layer having a lowerportion located in trenches of the insulation layer and an upper portion overlying the lower portion and the insulation layer is provided. The method comprises a first step of planarizing theupper portion of the metal layer and a second step of polishing the insulation layer and the lower portion of the metal layer. In the first step of planarizing the upper portion of the metal layer, the wafer and a polishing pad in urged at an applied pressure p and a relative velocity v in a contact mode between the waferand the polishing pad to promote an increased metal removal rate. In the second, the insulation layer and the lower portion of the metal layer are polished in a steady-state mode to formindividual metal lines in the trenches with minimal dishing of the metal lines and overpolishing of the insulation layer.
机译:标题:氧化铜大马士革结构的化学机械抛光[呃]摘要:一种化学机械抛光的方法金属镶嵌结构,包括绝缘层在晶片上具有沟槽,并具有较低的金属层位于绝缘层和上部的沟槽中的部分覆盖下部和绝缘层的部分是提供。所述方法包括使所述平面平坦化的第一步。金属层的上部和第二抛光步骤绝缘层和金属层的下部。在平坦化金属层上部的第一步,施加压力p推动晶片和抛光垫晶片之间的接触模式下的相对速度v和抛光垫,以促进增加的金属去除率。在第二,绝缘层和下部金属层的一部分以稳态模式抛光以形成沟槽中的单个金属线具有最小的凹陷金属线和绝缘层的过度抛光。

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