Scan path for designing sequential circuits with duplicate storage cells integrated in the scan path with or without inversion uses dependent storage cells

摘要

Storage cells each have a data-in input (2), a scan-in input (3), a data-out output (4), a scan-out output (5) and a control input (6) to change over between functional and scan modes. The data-in inputs and the data-out outputs connect to a combinatorial part of a sequential circuit to be tested. The scan-out outputs for the storage cells link to the scan-in inputs for each storage cell in sequence.