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Manufacturing process for manufacturing a spatial structure in a semiconductor substrate and semiconductor substrate with a device for etching a spatial structure in the semiconductor substrate

机译:用于在半导体衬底中制造空间结构的制造方法以及具有用于蚀刻半导体衬底中的空间结构的装置的半导体衬底

摘要

The invention relates to a process for producing a semiconductor substrate (1) is made of a semiconductor material with spatially etched structures, in particular of trench - structures for half conductor memory cells. First, a relief structure in a surface (2) of the semiconductor substrate (1) generates. Subsequently, an etch resistant layer (5) in a region (4) a side wall of the relief structure is deposited, so that during subsequent etching steps, the side wall substantially is not etched. Subsequently, an etching agent introduced into the relief structure and a potential field in the semiconductor substrate (1) is applied. As a result, a spatial structure, starting from a not from the etch-resistant layer (5) which are covered region of the relief structure, etched, wherein the spatial structure as a function of the potential field is.
机译:用于半导体衬底的制造方法技术领域本发明涉及一种用于制造半导体衬底(1)的方法,该半导体衬底由具有空间蚀刻的结构,尤其是用于半导体存储单元的沟槽结构的半导体材料制成。首先,在半导体衬底(1)的表面(2)中产生浮雕结构。随后,在浮雕结构的侧壁的区域(4)中沉积抗蚀刻层(5),使得在随后的蚀刻步骤期间,基本上不蚀刻侧壁。随后,施加引入浮雕结构的蚀刻剂和半导体衬底(1)中的势场。结果,从不是从抗浮雕结构的被覆盖区域的耐蚀刻层(5)开始,蚀刻了空间结构,其中,该空间结构是势场的函数。

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