首页> 外国专利> Storage system determines faulty memory cells of main memory and accesses auxiliary memory cell allocated to faulty address provided in auxiliary memory cell when faulty address is detected

Storage system determines faulty memory cells of main memory and accesses auxiliary memory cell allocated to faulty address provided in auxiliary memory cell when faulty address is detected

机译:存储系统确定主存储器的故障存储单元,并在检测到故障地址时访问分配给辅助存储单元中提供的故障地址的辅助存储单元

摘要

The storage system has a main memory (1) with several memory cells having allocated main memory addresses. A test module (3) determines faulty memory cells of the main memory and puts the allocated main memory addresses as fault addresses into an auxiliary memory (2). An evaluation module (4) compares the main memory address with the faulty address when the main memory is accessed. An auxiliary memory cell allocated to the faulty address provided in the auxiliary memory is accessed when the evaluation module detects a conformance of the main memory address with the faulty addresses.
机译:该存储系统具有主存储器(1),该主存储器(1)具有分配了主存储器地址的几个存储单元。测试模块(3)确定主存储器的故障存储单元,并将分配的主存储器地址作为故障地址放入辅助存储器(2)。当访问主存储器时,评估模块(4)将主存储器地址与错误地址进行比较。当评估模块检测到主存储器地址与故障地址相符时,访问分配给辅助存储器中提供的故障地址的辅助存储器单元。

著录项

  • 公开/公告号DE10155418A1

    专利类型

  • 公开/公告日2003-06-05

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2001155418

  • 发明设计人 ECKER WOLFGANG;

    申请日2001-11-12

  • 分类号G11C29/00;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:26

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号